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Unread 02-01-2011, 06:33 AM
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Default Fast Characterization of Functionalized Silica Materials by Silicon-29 Surface-Enhanced NMR Spectroscopy Using Dynamic Nuclear Polarization

Fast Characterization of Functionalized Silica Materials by Silicon-29 Surface-Enhanced NMR Spectroscopy Using Dynamic Nuclear Polarization

Moreno Lelli, David Gajan, Anne Lesage, Marc A. Caporini, Veronika Vitzthum, Pascal Mie?ville, Florent He?roguel, Fernando Rasco?n, Arthur Roussey, Chloe? Thieuleux, Malika Boualleg, Laurent Veyre, Geoffrey Bodenhausen, Christophe Cope?ret and Lyndon Emsley



Journal of the American Chemical Society
DOI: 10.1021/ja110791d




Source: Journal of the American Chemical Society
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